Eds analysis and elemental mapping services in Chelmsford, MA? The SEM was used to examine the crystal morphology, and the EDS spectrum showed primarily carbon and oxygen, with small amounts of nitrogen and phosphorous. This indicated an organic material as the primary component. Because the SEM-EDS analysis showed the material was primarily a carbon based organic crystalline material, a Fourier transform infrared spectroscopy (FTIR) examination was performed on the suspect material. This analysis provides necessary information about the functional groups of the organic material in order to identify the unknown organic.
SEM is a powerful surface microscopy method which allows for high resolution images to be obtained on a wide range of samples. A focused beam of electrons sweeps across a sample surface and an image is created from the scattered electrons. The electron beam allows for the accurate imaging of features below the resolution limit of visible light. The acquired pictures retain good depth of field, resulting in excellent three-dimensional images. Variations in beam parameters can be made in order to highlight variations in density in the target sample, show extremely fine surface features, and illustrate texture in sample surface coatings. MicroVision Labs has multiple fully-operational SEMs, Bruker X-Flash EDS detectors and mapping technology, backscatter electron (BSE) imaging, and large chamber capabilities. These provide a full suite of microscopy services for all of your analytical needs.
What is your standard turnaround time (TAT) and can it be expedited? Our standard TAT is 5 to 10 business days. We can provide faster TATs on request with the following surcharges: – Same day to 24 hour rush is 100% surcharge – 2 day rush is 75% surcharge – 3 day rush is 50% surcharge – 4 day rush is 25% surcharge Rush requests must have prior approval otherwise we cannot guarantee turnaround times. Find a few more details at microvision laboratories.
The scan from left to right shows a high tin concentration (green line) while areas of higher lead concentrations (blue line) were not intersected by the line scan. At the interface between the tin/lead solder and copper (red line), there is a mixture of the solder and copper which is the intermetallic layer. The EDS Map provides a nice visual mixture of colors which shows the intermetallic layer while the line scan clearly shows the intermetallic with the elemental graph.
MicroVision Laboratories, Inc. has been providing extensive expertise in micro-analytical techniques (FE-SEM, SEM, EDS, XRF, FTIR testing, PLM, X-Ray Imaging, DIC) and sample preparation since 2003. Our cutting edge, high-performance equipment combined with our solutions-focused customer service provide critical solutions for clients hailing from a broad range of industries ranging from medical to semiconductor, and from environmental to textile.
An affected floor tile was submitted to determine if the previous mold testing had missed a source on the tile backing or mastic. Additionally, a new tile from the same manufacturing lot was submitted for comparison. The process of preparing and examining the sample and reference tile was documented. Areas with darkened surface features were imaged and then cut out and examined. While the dark spots looked very discrete when examined by eye, under top light polarized microscopy they appeared more diffuse at the outer edges. The darkest areas surrounded what appeared to be particles embedded in the surface. Discover even more details on this website.